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About
Leadership
Divisions
Work with Us
Collaboration with CMU
History of Innovation at the SEI
Our Work
Agile
Artificial Intelligence Engineering
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Cybersecurity Center Development
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Publications
Authors
Matt Houy
Matt Houy
Matt Houy is an SEI alumni employee.
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An Analysis of Technical Observations in Insider Theft of Intellectual Property Cases
February 1, 2011
•
Technical Note
By
Michael Hanley
,
Tyler Dean
,
Will Schroeder
,
Matt Houy
,
Randall F. Trzeciak
,
Joji Montelibano