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About
Leadership
Divisions
Work with Us
Collaboration with CMU
History of Innovation at the SEI
Our Work
Agile
Artificial Intelligence Engineering
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Cyber Workforce Development
Cybersecurity Center Development
Cybersecurity Engineering
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All Projects
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Blog
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Technical Papers
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News
Events
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Publications
Authors
Peter J. Van Syckle
Peter Van Syckle
Peter J. Van Syckle is an SEI alumni employee.
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Using the Technology Readiness Levels Scale to Support Technology Management in the DoD's ATD/STO Environments (A Findings and Recommendations Report Conducted for Army CECOM)
September 1, 2002
•
Special Report
By
Caroline Graettinger
,
Suzanne Miller
,
Jeannine Siviy
,
Peter J. Van Syckle
,
Robert J. Schenk