A PSP Analysis of Defects Injected During Detailed Design
• Presentation
This presentation was given at the TSP Symposium on September 20-22, 2011.
Publisher
TSP Symposium
Subjects
Abstract
This presentation discusses how function types are the most common design defects, and they are the most costly to find and fix. In addition, the presenters found that half of the defects injected in design were found early in the process DLDR phase. They determined that 25% of design defects escape UT, phases prior to UT have similar defect find and fix costs, and that defects are five times more expensive to find and fix in UT than in earlier PSP phases.
Part of a Collection
TSP Symposium 2011 Proceedings and Presentations
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