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Technical Note

Risk Based Diagnostics

  • September 2004
  • By Ray C. Williams, Kathryn Ambrose Sereno, Laura Bentrem, Tom Merendino
  • The SEI has constructed a tentative "roadmap" for personnel involved in the systems and software acquisition community. This report describes the characteristics that determine whether a risk diagnostic method qualifies for the roadmap.
  • Acquisition Support
  • Publisher: Software Engineering Institute
    CMU/SEI Report Number: CMU/SEI-2004-TN-013
  • Abstract

    The Risk Focus Team at the Carnegie Mellon Software Engineering Institute (SEI) has identified a means of characterizing risk-based diagnostic methods and techniques. The Risk Focus Team has constructed a tentative "roadmap" for consultants, program managers, and other personnel involved in the systems and software acquisition community. The roadmap will help them to identify the appropriate risk diagnostic techniques for assessing threats to program success. 

    This technical note describes the characteristics that determine whether a risk diagnostic method qualifies for the roadmap. The technical note identifies three methods, the SEI Software Risk Evaluation, Architectural Tradeoff Analysis Method, and the SEI Commercial off-the-shelf (COTS) Usage Risk Evaluation that fit the characteristics described. The technical note also describes the characteristics of diagnostic methods that do not qualify for the roadmap.

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Cite This Report

SEI

Williams, Ray; Ambrose Sereno, Kathryn; Bentrem, Laura; & Merendino, Thomas. Risk Based Diagnostics. CMU/SEI-2004-TN-013. Software Engineering Institute, Carnegie Mellon University. 2004. http://resources.sei.cmu.edu/library/asset-view.cfm?AssetID=6909

IEEE

Williams. Ray, Ambrose Sereno. Kathryn, Bentrem. Laura, and Merendino. Thomas, "Risk Based Diagnostics," Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania, Technical Note CMU/SEI-2004-TN-013, 2004. http://resources.sei.cmu.edu/library/asset-view.cfm?AssetID=6909

APA

Williams, Ray., Ambrose Sereno, Kathryn., Bentrem, Laura., & Merendino, Thomas. (2004). Risk Based Diagnostics (CMU/SEI-2004-TN-013). Retrieved September 28, 2016, from the Software Engineering Institute, Carnegie Mellon University website: http://resources.sei.cmu.edu/library/asset-view.cfm?AssetID=6909

CHI

Ray Williams, Kathryn Ambrose Sereno, Laura Bentrem, & Thomas Merendino. Risk Based Diagnostics (CMU/SEI-2004-TN-013). Pittsburgh, PA: Software Engineering Institute, Carnegie Mellon University, 2004. http://resources.sei.cmu.edu/library/asset-view.cfm?AssetID=6909

MLA

Williams, Ray., Ambrose Sereno, Kathryn., Bentrem, Laura., & Merendino, Thomas. 2004. Risk Based Diagnostics (Technical Report CMU/SEI-2004-TN-013). Pittsburgh: Software Engineering Institute, Carnegie Mellon University. http://resources.sei.cmu.edu/library/asset-view.cfm?AssetID=6909

BibTex

@techreport{WilliamsRiskBased2004,
title={Risk Based Diagnostics},
author={Ray Williams and Kathryn Ambrose Sereno and Laura Bentrem and Thomas Merendino},
year={2004},
number={CMU/SEI-2004-TN-013},
institution={Software Engineering Institute, Carnegie Mellon University},
address={Pittsburgh, PA},
url={http://resources.sei.cmu.edu/library/asset-view.cfm?AssetID=6909} }